Temperature Forcing Workstation - Precision Hot/Cold Test for Semiconductor ICs
A Temperature Cycling Workstation is a test system used in semiconductor and electronics validation to repeatedly expose devices to controlled heating and cooling cycles.
Instead of maintaining a constant temperature, it forces the device under test (DUT) through rapid transitions between high and low temperatures, simulating real-world operating conditions and thermal stress.
- Application： BGA, LGA, QFN, QFP,SOP
- Nb of Pins： No limit
- Pitch： 0.35mm or above
