Support: PCIe Gen4 and SAS4.0

M.2 interface SSD Test Socket

M.2 interface SSD Test Socket

M.2接口SSD测试座ZIF结构设计,保护SSD的金手指不受划伤;顶窗式结构,结构精简,取放方便; 结构小巧,占空间小,便于量产;弹片式结构,导电体短,电阻小,可以实现高速传输; SSD测试座尺寸 支持不同规格的M.2固态硬盘,如2242、2260、2280等;采用全新夹紧结构,能够平稳夹紧金手指,不会对金手指造成损伤;支持自动

  • Application: PCBA
  • Nb of Pins: 64
  • Pitch: 0.5mm

M.2 interface SSD test socket


  • The ZIF structure design protects the golden fingers of the SSD from being scratched;

  • Top window structure, simple structure, easy to pick and place;

  • Compact structure, small space occupation, easy for mass production;

  • Shrapnel structure, short conductor, low resistance, can realize high-speed transmission;


SSD test socket size




  • Support M.2 SSDs of different specifications, such as 2242, 2260, 2280,  etc.;

  • Using a new clamping structure, it can clamp the gold finger smoothly without causing damage to the gold finger;

  • Support for automated testbenches.



Test Socket Material: Beryllium Copper, PEI, FR4 ESD

Probe Type: Spring Probe

Working temperature: -40 ~ 150℃

Service life: >100,000 times


Frequency of use: Above 7GHz

Design impedance: <=50Ω